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dc.contributor.authorHsieh, E. R.en_US
dc.contributor.authorGiordano, M.en_US
dc.contributor.authorHodson, B.en_US
dc.contributor.authorLevy, A.en_US
dc.contributor.authorOsekowsky, S. K.en_US
dc.contributor.authorRadway, R. M.en_US
dc.contributor.authorShih, Y. C.en_US
dc.contributor.authorWan, W.en_US
dc.contributor.authorWu, T. F.en_US
dc.contributor.authorZheng, X.en_US
dc.contributor.authorNelson, M.en_US
dc.contributor.authorLe, B. Q.en_US
dc.contributor.authorWong, H. -S. P.en_US
dc.contributor.authorMitra, S.en_US
dc.contributor.authorWong, S.en_US
dc.date.accessioned2020-10-05T02:01:28Z-
dc.date.available2020-10-05T02:01:28Z-
dc.date.issued2019-01-01en_US
dc.identifier.isbn978-1-7281-4031-5en_US
dc.identifier.issn2380-9248en_US
dc.identifier.urihttp://hdl.handle.net/11536/155249-
dc.description.abstractWe present the first demonstration of 1T4R Resistive RAM (RRAM) array storing two bits per RRAM cell. Our HfO2-based RRAM is built using a logic foundry technology that is fully compatible with the CMOS back-end process. We present a new approach to program RRAM cells using gradual SET/RESET pulses while minimizing disturbances on adjacent cells (belonging to the same 1T4R RRAM structure) this new approach makes pour multiple-bits-per-cell 1T4R RRAM array demonstration possible. We report over 106 cycles of endurance and a projected 10-year retention at 120 degrees C. Using measured data from our 2 bits-per-cell 1T4R RRAM array, we analyze multiple deep learning applications and demonstrate high degrees of inference accuracy (within 0.01% of ideal values).en_US
dc.language.isoen_USen_US
dc.titleHigh-Density Multiple Bits-per-Cell 1T4R RRAM Array with Gradual SET/RESET and its Effectiveness for Deep Learningen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000553550000083en_US
dc.citation.woscount0en_US
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