完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hsieh, E. R. | en_US |
dc.contributor.author | Giordano, M. | en_US |
dc.contributor.author | Hodson, B. | en_US |
dc.contributor.author | Levy, A. | en_US |
dc.contributor.author | Osekowsky, S. K. | en_US |
dc.contributor.author | Radway, R. M. | en_US |
dc.contributor.author | Shih, Y. C. | en_US |
dc.contributor.author | Wan, W. | en_US |
dc.contributor.author | Wu, T. F. | en_US |
dc.contributor.author | Zheng, X. | en_US |
dc.contributor.author | Nelson, M. | en_US |
dc.contributor.author | Le, B. Q. | en_US |
dc.contributor.author | Wong, H. -S. P. | en_US |
dc.contributor.author | Mitra, S. | en_US |
dc.contributor.author | Wong, S. | en_US |
dc.date.accessioned | 2020-10-05T02:01:28Z | - |
dc.date.available | 2020-10-05T02:01:28Z | - |
dc.date.issued | 2019-01-01 | en_US |
dc.identifier.isbn | 978-1-7281-4031-5 | en_US |
dc.identifier.issn | 2380-9248 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/155249 | - |
dc.description.abstract | We present the first demonstration of 1T4R Resistive RAM (RRAM) array storing two bits per RRAM cell. Our HfO2-based RRAM is built using a logic foundry technology that is fully compatible with the CMOS back-end process. We present a new approach to program RRAM cells using gradual SET/RESET pulses while minimizing disturbances on adjacent cells (belonging to the same 1T4R RRAM structure) this new approach makes pour multiple-bits-per-cell 1T4R RRAM array demonstration possible. We report over 106 cycles of endurance and a projected 10-year retention at 120 degrees C. Using measured data from our 2 bits-per-cell 1T4R RRAM array, we analyze multiple deep learning applications and demonstrate high degrees of inference accuracy (within 0.01% of ideal values). | en_US |
dc.language.iso | en_US | en_US |
dc.title | High-Density Multiple Bits-per-Cell 1T4R RRAM Array with Gradual SET/RESET and its Effectiveness for Deep Learning | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000553550000083 | en_US |
dc.citation.woscount | 0 | en_US |
顯示於類別: | 會議論文 |