標題: | A Comprehensive Modeling Framework for Ferroelectric Tunnel Junctions |
作者: | Huang, Hsin-Hui Wu, Tzu-Yun Chu, Yueh-Hua Wu, Ming-Hung Hsu, Chien-Hua Lee, Heng-Yuan Sheu, Shyh-Shyuan Lo, Wei-Chung Hou, Tuo-Hung 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-一月-2019 |
摘要: | A modeling framework for ferroelectric tunnel junctions (FTJs) that considers nonpolar interfacial layers (ILs), multi-domain polarization, and complete ferroelectric/capacitive/tunneling currents simultaneously is proposed. This model explains both read and write operations including the controversial switching polarities of FTJ. We also provide useful guidelines for optimizing FTJ performance where the location of IL and the effective thickness ratio between ferroelectric and interfacial layers are found to be most critical. |
URI: | http://hdl.handle.net/11536/155255 |
ISBN: | 978-1-7281-4031-5 |
ISSN: | 2380-9248 |
期刊: | 2019 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 會議論文 |