Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Solis Canto, O. | en_US |
dc.contributor.author | Murillo-Bracamontes, E. A. | en_US |
dc.contributor.author | Gervacio-Arciniega, J. J. | en_US |
dc.contributor.author | Toledo-Solano, M. | en_US |
dc.contributor.author | Torres-Miranda, G. | en_US |
dc.contributor.author | Cruz-Valeriano, E. | en_US |
dc.contributor.author | Chu, Y. H. | en_US |
dc.contributor.author | Palomino-Ovando, M. A. | en_US |
dc.contributor.author | Enriquez-Flores, C. I. | en_US |
dc.contributor.author | Mendoza, M. E. | en_US |
dc.contributor.author | Hmok, H'Linh | en_US |
dc.contributor.author | Cruz, M. P. | en_US |
dc.date.accessioned | 2020-10-05T02:01:53Z | - |
dc.date.available | 2020-10-05T02:01:53Z | - |
dc.date.issued | 2020-08-28 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/5.0013287 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/155317 | - |
dc.description.abstract | Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO3/DyScO3(110) thin film, obtained with long (k(c)=0.82N/m) and short (k(c)=7.64N/m) cantilevers, were analyzed as a function of the applied voltage frequency. For long cantilevers, the electrostatic and electrostrictive contributions were identified. These contributions were reduced with a frequency near the second mode of the contact resonance; while for short cantilevers, the first mode was necessary. A method for domain structure analyses, to discriminate a ferroelectric behavior from a non-ferroelectric, through the optimization of PFM images, is also described. The analysis can be extended to cantilevers with different spring constants and ferroelectric materials. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/5.0013287 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 128 | en_US |
dc.citation.issue | 8 | en_US |
dc.citation.spage | 0 | en_US |
dc.citation.epage | 0 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000565316500001 | en_US |
dc.citation.woscount | 0 | en_US |
Appears in Collections: | Articles |