Total-Dose Effect of X-ray Irradiation on Low-TemperaturePolycrystalline Silicon Thin-Film Transistors (vol 41, pg 864, 2020)

doi:10.1109/LED.2020.3012271

標題:	Total-Dose Effect of X-ray Irradiation on Low-TemperaturePolycrystalline Silicon Thin-Film Transistors (vol 41, pg 864, 2020)
作者:	Tai, Ya-Hsiang Yeh, Shan Huang, Shih-Hsuan Chang, Ting-Chang 電機學院光電工程學系 College of Electrical and Computer Engineering Department of Photonics
公開日期:	1-九月-2020
摘要:	In The above article [1], the Acknowledgment was deleted in error. Therefore, the Acknowledgment is added below. This change had no influence on the discussion and conclusions in the article.
URI:	http://dx.doi.org/10.1109/LED.2020.3012271 http://hdl.handle.net/11536/155488
ISSN:	0741-3106
DOI:	10.1109/LED.2020.3012271
期刊:	IEEE ELECTRON DEVICE LETTERS
Volume:	41
Issue:	9
起始頁:	1448
結束頁:	1448
顯示於類別：	期刊論文