Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jiang, Iris Hui-Ru | en_US |
dc.contributor.author | Chang, Hua-Yu | en_US |
dc.contributor.author | Chang, Chih-Long | en_US |
dc.date.accessioned | 2014-12-08T15:22:17Z | - |
dc.date.available | 2014-12-08T15:22:17Z | - |
dc.date.issued | 2012-04-01 | en_US |
dc.identifier.issn | 1063-8210 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/TVLSI.2011.2116049 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/15775 | - |
dc.description.abstract | Due to excessive current densities, electromigration (EM) may trigger a permanent open- or short-circuit failure in signal wires or power networks in analog or mixed-signal circuits. As the feature size keeps shrinking, this effect becomes a key reliability concern. Hence, in this paper, we focus on wiring topology generation for avoiding EM at the routing stage. Prior works tended towards heuristics; on the contrary, we first claim this problem belongs to class P instead of class NP-hard. Our breakthrough is, via the proof of the greedy-choice property, we successfully model this problem on a multi-source multi-sink flow network and then solve it by a strongly polynomial time algorithm. Experimental results prove the effectiveness and efficiency of our algorithm. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Algorithms | en_US |
dc.subject | electromigration (EM) | en_US |
dc.subject | global routing | en_US |
dc.subject | integrated circuit reliability | en_US |
dc.subject | linear programming | en_US |
dc.title | WiT: Optimal Wiring Topology for Electromigration Avoidance | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/TVLSI.2011.2116049 | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | en_US |
dc.citation.volume | 20 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 581 | en_US |
dc.citation.epage | 592 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000302085300001 | - |
dc.citation.woscount | 3 | - |
Appears in Collections: | Articles |
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