完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Pan, Jui-Wen | en_US |
dc.date.accessioned | 2014-12-08T15:23:15Z | - |
dc.date.available | 2014-12-08T15:23:15Z | - |
dc.date.issued | 2010 | en_US |
dc.identifier.isbn | 978-0-81948-082-8 | en_US |
dc.identifier.issn | 0277-786X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/16324 | - |
dc.identifier.uri | http://dx.doi.org/10.1117/12.868798 | en_US |
dc.description.abstract | We proposed a modified testing equipment for adjusting the back focal length of compact camera module (CCM). The advantages of this modified testing equipment with conversion lens were testing space saving, small size testing chart, high speed chart changing, and variable object distances. The testing chart displacement of 0.17 mm in the modified testing equipment can produce the equivalent testing chart displacement of 1000 mm in the conventional testing equipment. At the regular object distance of 2000 mm, both total track and testing chart size of the modified test equipment were 1.6% of that of the conventional testing equipment. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | compact camera module | en_US |
dc.subject | magnification | en_US |
dc.subject | reduction ratio | en_US |
dc.subject | CMOS sensor | en_US |
dc.title | The First Order Optics of Novel Testing Equipment for Compact Camera Module | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1117/12.868798 | en_US |
dc.identifier.journal | INTERNATIONAL OPTICAL DESIGN CONFERENCE 2010 | en_US |
dc.citation.volume | 7652 | en_US |
dc.contributor.department | 光電系統研究所 | zh_TW |
dc.contributor.department | Institute of Photonic System | en_US |
dc.identifier.wosnumber | WOS:000285843900049 | - |
顯示於類別: | 會議論文 |