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dc.contributor.authorLee, Jen-Weien_US
dc.contributor.authorHsiao, Ju-Hungen_US
dc.contributor.authorChang, Hsie-Chiaen_US
dc.contributor.authorLee, Chen-Yien_US
dc.date.accessioned2014-12-08T15:23:15Z-
dc.date.available2014-12-08T15:23:15Z-
dc.date.issued2012-05-01en_US
dc.identifier.issn1549-7747en_US
dc.identifier.urihttp://hdl.handle.net/11536/16326-
dc.description.abstractNowadays, differential power-analysis (DPA) attacks are a serious threat for cryptographic systems due to the inherent existence of data-dependent power consumption. Hiding power consumption of encryption circuit or applying key-blinded techniques can increase the security against DPA attacks, but they result in a large overhead for hardware cost, execution time, and energy dissipation. In this brief, a new DPA countermeasure performing all field operations in a randomized Montgomery domain is proposed to eliminate the correlation between target and reference power traces. After implemented in 90-nm CMOS process, our protected 521-bit dual-field elliptic curve (EC) cryptographic processor can perform one EC scalar multiplication in 8.08 ms over GF(p(521)) and 4.65 ms over GF(2(409)), respectively, with 4.3% area and 5.2% power overhead. Experiments from a field-programmable gate array evaluation board demonstrate that the private key of unprotected device will be revealed within 10(3) power traces, whereas the same attacks on our proposal cannot successfully extract the key value even after 10(6) measurements.en_US
dc.language.isoen_USen_US
dc.subjectDual fieldsen_US
dc.subjectelliptic curve (EC) cryptography (ECC)en_US
dc.subjectpower-analysis attacksen_US
dc.subjectsecurity systemen_US
dc.titleAn Efficient DPA Countermeasure With Randomized Montgomery Operations for DF-ECC Processoren_US
dc.typeArticleen_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSen_US
dc.citation.volume59en_US
dc.citation.issue5en_US
dc.citation.epage287en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000304150000007-
dc.citation.woscount3-
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