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dc.contributor.authorBalke, Ninaen_US
dc.contributor.authorJesse, Stephenen_US
dc.contributor.authorChu, Ying-Haoen_US
dc.contributor.authorKalinin, Sergei V.en_US
dc.date.accessioned2014-12-08T15:23:35Z-
dc.date.available2014-12-08T15:23:35Z-
dc.date.issued2012-06-01en_US
dc.identifier.issn1936-0851en_US
dc.identifier.urihttp://hdl.handle.net/11536/16493-
dc.description.abstractThe coupling between electrical and mechanical phenomena is a ubiquitous feature of many information and energy storage materials and devices. In addition to involvement in performance and degradation mechanisms, electromechanical effects underpin a broad spectrum of nanoscale imaging and spectroscopies including piezoresponse force and electrochemical strain microscopies. Traditionally, these studies are conducted under ambient conditions. However, applications related to imaging energy storage and electrophysiological phenomena require operation in a liquid phase and therefore the development of electromechanical probing techniques suitable to liquid environments. Due to the relative high conductivity of most liquids and liquid decomposition at low voltages, the transfer of characterization techniques from ambient to liquid is not straightforward. Here we present a detailed study of ferroelectric domain imaging and manipulation in thin film BiFeO3 using piezoresponse force microscopy in liquid environments as model systems for electromechanical phenomena in general. We explore the use of contact resonance enhancement and the application of multifrequency excitation and detection principles to overcome the experimental problems introduced by a liquid environment. Understanding electromechanical sample characterization in liquid is a key aspect not only for ferroelectric oxides but also for biological and electrochemical sample systems.en_US
dc.language.isoen_USen_US
dc.subjectscanning probe microscopyen_US
dc.subjectliquiden_US
dc.subjectferroelectricsen_US
dc.titleHigh-Frequency Electromechanical Imaging of Ferroelectrics in a Liquid Environmenten_US
dc.typeArticleen_US
dc.identifier.journalACS NANOen_US
dc.citation.volume6en_US
dc.citation.issue6en_US
dc.citation.epage5559en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000305661300111-
dc.citation.woscount4-
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