标题: | Experimental Verification of RF Stress Effect on Cascode Class-E PA Performance and Reliability |
作者: | Yuan, Jiann-Shiun Yen, Hsuan-Der Chen, Shuyu Wang, Ruey-Lue Huang, Guo-Wei Juang, Ying-Zong Tu, Chih-Ho Yeh, Wen-Kuan Ma, Jun 电子工程学系及电子研究所 Department of Electronics Engineering and Institute of Electronics |
关键字: | Cascode class E;gate oxide breakdown;output power;power amplifier (PA);power efficiency;reliability |
公开日期: | 1-六月-2012 |
摘要: | A cascode class-E power amplifier (PA) operating at 5.2 GHz has been designed using Advanced Design System simulation. RF circuit performances such as output power and power-added efficiency before and after RF stress have been experimentally investigated. The measured output power, power-added efficiency, and linearity after high-input-power RF stress at elevated supply voltage show significant circuit degradations. The impact of hot-carrier injection and gate oxide soft breakdown on cascode class-E PA reliability is discussed. |
URI: | http://hdl.handle.net/11536/16522 |
ISSN: | 1530-4388 |
期刊: | IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY |
Volume: | 12 |
Issue: | 2 |
结束页: | 369 |
显示于类别: | Articles |
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