标题: | A digital BIST methodology for spread spectrum clock generators |
作者: | Chou, Maohsuan Hsu, Jenchien Su, Chauchin 電控工程研究所 Institute of Electrical and Control Engineering |
公开日期: | 2006 |
摘要: | In this paper, a built-in-self-test methodology for spread-spectrum clock generators is presented. It utilizes a multi-phase phase detector to detect the linearity of the frequency variation and the short-term jitter. The methodology is analyzed and simulated. As an all digital design, the hardware overhead is very small. |
URI: | http://hdl.handle.net/11536/17149 |
ISBN: | 978-0-7695-2628-7 |
ISSN: | 1081-7735 |
期刊: | PROCEEDINGS OF THE 15TH ASIAN TEST SYMPOSIUM |
起始页: | 251 |
结束页: | 254 |
显示于类别: | Conferences Paper |