完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHung, Chih-Deen_US
dc.contributor.authorWuen, Wen-Shenen_US
dc.contributor.authorChou, Mei-Fenen_US
dc.contributor.authorWen, Kuei-Annen_US
dc.date.accessioned2014-12-08T15:24:44Z-
dc.date.available2014-12-08T15:24:44Z-
dc.date.issued2006en_US
dc.identifier.isbn978-2-9600551-5-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/17188-
dc.identifier.urihttp://dx.doi.org/10.1109/ECWT.2006.280454en_US
dc.description.abstractThis paper presents a unified RF behavior model that simultaneously predicts the effects of noise, nonlinearity, impedance matching and frequency response and that enables efficient and accurate system simulation. The proposed modeling approach allows characterizing the RF effects incrementally to reduce iteration. A Verilog-A behavior model for an ultra-wideband CMOS low noise amplifier is developed for fast and accurate system simulation. The system simulation results show that the behavior model agrees well with the transistor-level circuit with RMS error less than 0.79%. Ultimately, 87% reduction of simulation time is achieved.en_US
dc.language.isoen_USen_US
dc.subjectRF behavior modelen_US
dc.subjectlow noise amplifieren_US
dc.titleA unified behavior model of low noise amplifier for system-level simulationen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/ECWT.2006.280454en_US
dc.identifier.journal2006 EUROPEAN CONFERENCE ON WIRELESS TECHNOLOGIESen_US
dc.citation.spage139en_US
dc.citation.epage142en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000245511600036-
顯示於類別:會議論文


文件中的檔案:

  1. 000245511600036.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。