標題: System-level ESD protection design with on-chip transient detection circuit
作者: Yen, Cheng-Cheng
Ker, Ming-Dou
Shih, Pi-Chia
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2006
摘要: A new on-chip transient detection circuit for system-level electrostatic (d) under bar ischarge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13-mu m CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.
URI: http://hdl.handle.net/11536/17421
http://dx.doi.org/10.1109/ICECS.2006.379864
ISBN: 978-1-4244-0394-3
DOI: 10.1109/ICECS.2006.379864
期刊: 2006 13TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS, VOLS 1-3
起始頁: 616
結束頁: 619
Appears in Collections:Conferences Paper


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