The relationship between density of MgO thin films and panel properties in AC-PDP

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DC 欄位	值	語言
dc.contributor.author	Lee, Wei-Cheng	en_US
dc.contributor.author	Kim, Sung-O	en_US
dc.contributor.author	Chen, Kuang-Lang	en_US
dc.contributor.author	Chen, Samuel	en_US
dc.contributor.author	Lee, Chien-Pang	en_US
dc.contributor.author	Huang, Chih-Ming	en_US
dc.date.accessioned	2014-12-08T15:25:11Z	-
dc.date.available	2014-12-08T15:25:11Z	-
dc.date.issued	2005	en_US
dc.identifier.uri	http://hdl.handle.net/11536/17573	-
dc.description.abstract	The MgO thin films for AC-PDPs are deposited by c-beam evaporation with varied oxygen flow rate and e-beam current. The panel properties such as luminance, response time, dynamic margin, color temperature and CIE coordinate are characterized as a function of time with the aging environment. The result reveals that a plasma display panel with MgO thin film of lower 02 flow rate would provide better panel properties due to higher density of MgO thin film and higher cystallinity companied with higher surface roughness.	en_US
dc.language.iso	en_US	en_US
dc.title	The relationship between density of MgO thin films and panel properties in AC-PDP	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	IDW/AD '05: PROCEEDINGS OF THE 12TH INTERNATIONAL DISPLAY WORKSHOPS IN CONJUNCTION WITH ASIA DISPLAY 2005, VOLS 1 AND 2	en_US
dc.citation.spage	1571	en_US
dc.citation.epage	1574	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000258488800414	-
顯示於類別：	會議論文