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dc.contributor.authorJian, ZCen_US
dc.contributor.authorLin, JYen_US
dc.contributor.authorHsieh, PJen_US
dc.contributor.authorChen, HWen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:25:14Z-
dc.date.available2014-12-08T15:25:14Z-
dc.date.issued2005en_US
dc.identifier.isbn0-8194-5856-2en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/17611-
dc.identifier.urihttp://dx.doi.org/10.1117/12.612482en_US
dc.description.abstractBased on the heterodyne interferometry and Fresnel equations, an alternative method for measuring the complex refractive index of a turbid medium. A light beam is incident on the boundary between a right-angle prism and a turbid medium. The phase difference between s- and p- polarizations of the reflected light occurs. The phase difference depends on then incident angle and the complex refractive index of a turbid medium-, their relation can be derived from Fresnel equations. The phase difference can be measured accurately with the heterodyne interferometry. Because there are two unknown parameters to be estimated, at least the phase differences under two different conditions should be measured. Then, these measured data are substituted into the derived relation, and a set simultaneous equation is obtained. If the simultaneous equation is solved. the complex refractive index can be estimated. Because the reflected light from the boundary is measured, the scattering noises coming from the turbidity of the tested medium can be greatly reduced. In addition, this method has some merits such as simple optical setup, high sensitivity, high stability, and suitability for a little amount of the tested medium in its native state (without dilution).en_US
dc.language.isoen_USen_US
dc.subjectheterodyne interferometryen_US
dc.subjectcomplex refractive indexen_US
dc.subjectturbid mediumen_US
dc.titleA method for measuring the complex refractive index of a turbid mediumen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.612482en_US
dc.identifier.journalOptical Measurement Systems for Industrial Inspection IV, Pts 1 and 2en_US
dc.citation.volume5856en_US
dc.citation.spage1036en_US
dc.citation.epage1043en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000231416400119-
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