Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Liou, Hung-Guang	en_US
dc.contributor.author	Tai, Ya-Hsiang	en_US
dc.date.accessioned	2014-12-08T15:25:30Z	-
dc.date.available	2014-12-08T15:25:30Z	-
dc.date.issued	2005	en_US
dc.identifier.isbn	978-957-28522-2-4	en_US
dc.identifier.uri	http://hdl.handle.net/11536/17902	-
dc.description.abstract	In this paper, the LTPS TFT shift register circuit is simulated with Monte Carlo method to evaluate the effects due to the non-uniformity in the LTPS TFT characteristics. A computationally efficient method has been presented for the estimation of the power distribution and the yield in the presence of device variations.	en_US
dc.language.iso	en_US	en_US
dc.title	Evaluation of the operation for the shift register circuit implemented by low temperature poly-Si thin-film transistors	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	IDMC 05: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2005	en_US
dc.citation.spage	453	en_US
dc.citation.epage	455	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000259399200122	-
顯示於類別：	會議論文