標題: | Enhancing sequential depth computation with a branch-and-bound algorithm |
作者: | Yen, CC Jou, JY 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2004 |
摘要: | We present an effective algorithm to enhance sequential depth computation. The sequential depth plays the most crucial role to the completeness of bounded model checking. Previous work computes the sequential depth by exhaustively searching the state space, which is unable to keep pace with the exponential growth of design complexity. To improve the computation, we develop an efficient approach that takes the branch-and-bound manner. We reduce the search space by applying a partitioning as well as a pruning method. Furthermore, we propose a novel formulation and integrate the techniques of BDDs and SAT solvers to search states that determine the sequential depth. Experimental results show that our approach considerably enhances the performance compared with the results of the previous work. |
URI: | http://hdl.handle.net/11536/18142 |
ISBN: | 0-7803-8714-7 |
ISSN: | 1552-6674 |
期刊: | NINTH IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS |
起始頁: | 3 |
結束頁: | 8 |
顯示於類別: | 會議論文 |