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dc.contributor.authorSu, DCen_US
dc.contributor.authorChen, JHen_US
dc.contributor.authorChen, KHen_US
dc.contributor.authorLin, JYen_US
dc.date.accessioned2014-12-08T15:25:44Z-
dc.date.available2014-12-08T15:25:44Z-
dc.date.issued2004en_US
dc.identifier.isbn0-8194-5379-Xen_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/18145-
dc.identifier.urihttp://dx.doi.org/10.1117/12.544484en_US
dc.description.abstractA light beam is incident on the boundary surface between the thin metal film of a surface-plasmon-resonance (SPR) apparatus and the test medium. If the incident angle is equal or very near to the resonant angle, then the phase difference between p- and s- polarizations of the reflected light is related to the associated physical parameter. The phase difference can be measured accurately by the heterodyne interferometry. If the relation between the phase difference and the associated physical parameter is specified, the associated physical parameter can be estimated with the data of the phase difference. This method has the advantages of both common-path interferometry and heterodyne interferometry.en_US
dc.language.isoen_USen_US
dc.subjectsurface-plasmon resonanceen_US
dc.subjectheterodyne interferometryen_US
dc.subjectphysical parameteren_US
dc.titleSurface plasmon resonance heterodyne interferometry from measuring physical parametersen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.544484en_US
dc.identifier.journalOPTICAL METROLOGY IN PRODUCTION ENGINEERINGen_US
dc.citation.volume5457en_US
dc.citation.spage566en_US
dc.citation.epage573en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000224432300062-
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