Dynamic analog testing via ATE digital test channels

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DC 欄位	值	語言
dc.contributor.author	Su, CC	en_US
dc.contributor.author	Chang, CS	en_US
dc.contributor.author	Huang, HW	en_US
dc.contributor.author	Tu, DS	en_US
dc.contributor.author	Lee, CL	en_US
dc.contributor.author	Lin, JCH	en_US
dc.date.accessioned	2014-12-08T15:25:45Z	-
dc.date.available	2014-12-08T15:25:45Z	-
dc.date.issued	2004	en_US
dc.identifier.isbn	0-7695-2235-1	en_US
dc.identifier.issn	1081-7735	en_US
dc.identifier.uri	http://hdl.handle.net/11536/18185	-
dc.identifier.uri	http://dx.doi.org/10.1109/ATS.2004.37	en_US
dc.description.abstract	A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.	en_US
dc.language.iso	en_US	en_US
dc.title	Dynamic analog testing via ATE digital test channels	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.doi	10.1109/ATS.2004.37	en_US
dc.identifier.journal	13TH ASIAN TEST SYMPOSIUM, PROCEEDINGS	en_US
dc.citation.spage	308	en_US
dc.citation.epage	312	en_US
dc.contributor.department	電機學院	zh_TW
dc.contributor.department	College of Electrical and Computer Engineering	en_US
dc.identifier.wosnumber	WOS:000225878400050	-
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