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dc.contributor.authorKer, MDen_US
dc.contributor.authorKuo, BJen_US
dc.date.accessioned2014-12-08T15:25:47Z-
dc.date.available2014-12-08T15:25:47Z-
dc.date.issued2004en_US
dc.identifier.isbn0-7803-8333-8en_US
dc.identifier.issn1529-2517en_US
dc.identifier.urihttp://hdl.handle.net/11536/18224-
dc.description.abstractThe resulting capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broadband RF circuits due to the impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the D performance. A new distributed ESD protection structure is proposed in this work to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device size, named decreasing-size distributed ESD (DS-DESD) protection scheme, which is beneficial to the ESD level. The experimental results had shown the human-body-model (HBM) ESD robustness of up to 8kV.en_US
dc.language.isoen_USen_US
dc.subjectelectrostatic discharge (ESD)en_US
dc.subjectdistributed ESD (DESD)en_US
dc.subjectcoplanar waveguideen_US
dc.subjectbroadband RF circuitsen_US
dc.titleESD protection design for broadband RF circuits with decreasing-size distributed protection schemeen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2004 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERSen_US
dc.citation.spage383en_US
dc.citation.epage386en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000222534600086-
Appears in Collections:Conferences Paper