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dc.contributor.authorLiang, ZHen_US
dc.contributor.authorCheng, YTen_US
dc.contributor.authorHsu, Wen_US
dc.contributor.authorLee, YWen_US
dc.date.accessioned2014-12-08T15:25:48Z-
dc.date.available2014-12-08T15:25:48Z-
dc.date.issued2004en_US
dc.identifier.isbn0-7803-8365-6en_US
dc.identifier.issn0569-5503en_US
dc.identifier.urihttp://hdl.handle.net/11536/18235-
dc.description.abstractIn order to lower the packaging cost and resolve the process complexity of MEMS fabrications, a new wafer-level post-process hermetic package using UV curable adhesive bonding is introduced for MEMS applications. The UV curable adhesive is cured through UV light exposure without any additional heating, suitable for packaging the devices with temperature sensitive materials or processes. A Pyrex 7740 glass is micromachined and used as a protection cap substrate with microcavities which is spin-coated with the adhesive, aligned, and bonded with a device substrate to form the package after the UV curing. Finally, electrical contact pads expose and die separation are done simultaneously by dicing. Two different monitoring devices, dew point sensor and capacitive accelerometer are built to evaluate the package strength and hermeticity. After dicing operation, no structure damage or stiction phenomenon is found in the packaged capacitive accelerometer. Furthermore, no moisture condensation is observed in the package with 190mum bonding width after 150 minutes boil water immersion. The acceleration test results indicate the package can survive more than 3 weeks at 25degreesC, 100% R.H. (Relative Humidity) working environment.en_US
dc.language.isoen_USen_US
dc.titleA low temperature wafer-level hermetic MEMS package using UV curable adhesiveen_US
dc.typeProceedings Paperen_US
dc.identifier.journal54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGSen_US
dc.citation.spage1486en_US
dc.citation.epage1491en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000224340900233-
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