Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution

Full metadata record

DC Field	Value	Language
dc.contributor.author	Ker, MD	en_US
dc.contributor.author	Peng, JJ	en_US
dc.contributor.author	Jiang, HC	en_US
dc.date.accessioned	2014-12-08T15:26:28Z	-
dc.date.available	2014-12-08T15:26:28Z	-
dc.date.issued	2002	en_US
dc.identifier.isbn	0-7803-7416-9	en_US
dc.identifier.uri	http://hdl.handle.net/11536/18796	-
dc.language.iso	en_US	en_US
dc.title	Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS	en_US
dc.citation.spage	84	en_US
dc.citation.epage	89	en_US
dc.contributor.department	電機學院	zh_TW
dc.contributor.department	College of Electrical and Computer Engineering	en_US
dc.identifier.wosnumber	WOS:000177689400016	-
Appears in Collections:	Conferences Paper