Title: Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution
Authors: Ker, MD
Peng, JJ
Jiang, HC
電機學院
College of Electrical and Computer Engineering
Issue Date: 2002
URI: http://hdl.handle.net/11536/18796
ISBN: 0-7803-7416-9
Journal: PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS
Begin Page: 84
End Page: 89
Appears in Collections:Conferences Paper