Full metadata record
DC FieldValueLanguage
dc.contributor.authorLee, JSen_US
dc.contributor.authorHsu, PLen_US
dc.date.accessioned2014-12-08T15:26:29Z-
dc.date.available2014-12-08T15:26:29Z-
dc.date.issued2002en_US
dc.identifier.isbn0-7803-7087-2en_US
dc.identifier.issn1062-922Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/18809-
dc.description.abstractThe `basic element' approach has been proposed for evaluating the complexity of sequence control designs using the ladder logic diagram (LLD) and Petri net (PN). Whereas basic elements in the LLD stand for push buttons, limited switches, relay coils, timers, counters, solenoids, and lines, they are places, transitions, and arcs in the PN. Since basic elements for different structures have different physical meanings, the basic element approach may lead to misleading comparison and unreliable results. Thus, a suitable and unified measure for analyzing the LLD and PN is pursued. In this paper, a new approach via the IF-THEN transformation is proposed. The same measure obtained from the IF-THEN rules and corresponding logic operators can then be suitably applied to both LLD and PN. The provided example is of five sequences with increasing complexity for a stamping process. It indicates that the proposed IF-THEN transformation is more appropriate than the basic element approach in real applications. Moreover, results clearly show that the PN is more suitable than LLD for sequence control design as processes become more complex.en_US
dc.language.isoen_USen_US
dc.subjectLLD (ladder logic diagram)en_US
dc.subjectPN (Petri net)en_US
dc.subjectIF-THEN transformationen_US
dc.subjectPLC (programmable logic controllers)en_US
dc.subjectsequence controllersen_US
dc.titleA new approach to evaluate ladder logic diagrams and Petri nets via the IF-THEN transformationen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2001 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS, VOLS 1-5: E-SYSTEMS AND E-MAN FOR CYBERNETICS IN CYBERSPACEen_US
dc.citation.spage2711en_US
dc.citation.epage2716en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000177404200477-
Appears in Collections:Conferences Paper