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dc.contributor.authorKer, MDen_US
dc.contributor.authorLo, WYen_US
dc.contributor.authorLee, CMen_US
dc.contributor.authorChen, CPen_US
dc.contributor.authorKao, HSen_US
dc.date.accessioned2014-12-08T15:26:31Z-
dc.date.available2014-12-08T15:26:31Z-
dc.date.issued2002-01-01en_US
dc.identifier.isbn0-7803-7246-8en_US
dc.identifier.issn1529-2517en_US
dc.identifier.urihttp://hdl.handle.net/11536/18834-
dc.description.abstractThis paper presents a state-of-art ESD protection design for RF circuit with a human-body-model (HBAP ESD robustness of 8kV. By including a turn-on efficient power-rails clamp circuit into the RF circuit, the ESD clamp devices of the RF input pin are operated in the forward-biased conduction, rather than the traditional junction breakdown condition Therefore, the dimension of ESD devices for the RF input pin can be further downsized to reduce the input capacitance loading for the RF signal This design has been successfully applied in a 900-MHz RF receiver and fabricated in 0.25-mum CMOS process with a thick top metal layer. The experimental results have confirmed that its ESD robustness is as high as >8kV under the HBM ESD test.en_US
dc.language.isoen_USen_US
dc.titleESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustnessen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2002 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERSen_US
dc.citation.volumeen_US
dc.citation.issueen_US
dc.citation.spage427en_US
dc.citation.epage430en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000176890600098-
Appears in Collections:Conferences Paper