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dc.contributor.authorWang, SMen_US
dc.contributor.authorWu, CKen_US
dc.date.accessioned2014-12-08T15:26:37Z-
dc.date.available2014-12-08T15:26:37Z-
dc.date.issued2002en_US
dc.identifier.isbn0-7803-7448-7en_US
dc.identifier.urihttp://hdl.handle.net/11536/18918-
dc.description.abstractThis paper describes an experimental 32Kx8 CMOS SRAM with a 9ns access time at a supply voltage of 3V using a 0.35um 1P2M CMOS logic technology. Based on the full current-mode techniques for read/write operation, the sensing speed and write pulse width are insensitive to the bit-line capacitance. Due to these techniques, the voltage swing at the bit-line and data-line can be kept quite small all the time. The active current is 28mA at 100MHz under typical conditions.en_US
dc.language.isoen_USen_US
dc.titleFull current-mode techniques for high-speed CMOS SRAMsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2002 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL IV, PROCEEDINGSen_US
dc.citation.spage580en_US
dc.citation.epage582en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000186328300146-
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