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dc.contributor.authorChao, YFen_US
dc.contributor.authorLin, Aen_US
dc.contributor.authorWang, MWen_US
dc.date.accessioned2014-12-08T15:26:45Z-
dc.date.available2014-12-08T15:26:45Z-
dc.date.issued2001en_US
dc.identifier.isbn0-8194-4325-5en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19011-
dc.identifier.urihttp://dx.doi.org/10.1117/12.446589en_US
dc.description.abstractFor in situ/real time measurement, a retarder is substituted by a photoelastic modulator (PEM) in a polarimetry. The azimuthal position of the strain axis of PEM is directly determined with respect to the orientation of the transmission axis of polarizer and analyzer. The Mueller matrix of a twisted nematic liquid crystal (TN-LCD) is derived analytically. The phase retardation and the twisted angle of a TN-LCD are numerically obtained through two successive measurements of the Mueller polarimeter.en_US
dc.language.isoen_USen_US
dc.subjectpolarimetryen_US
dc.subjectphotoelastic modulationen_US
dc.subjectcircular dichroismen_US
dc.subjectliquid crystalen_US
dc.titlePhotoelastic modulation polarimetry and its measurement of twisted nematic liquid crystalen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1117/12.446589en_US
dc.identifier.journalPHOTONIC SYSTEMS AND APPLICATIONSen_US
dc.citation.volume4595en_US
dc.citation.spage43en_US
dc.citation.epage51en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000174463600006-
Appears in Collections:Conferences Paper


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