Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wang, CY | en_US |
dc.contributor.author | Tung, SW | en_US |
dc.contributor.author | Jou, JY | en_US |
dc.date.accessioned | 2014-12-08T15:26:47Z | - |
dc.date.available | 2014-12-08T15:26:47Z | - |
dc.date.issued | 2001 | en_US |
dc.identifier.isbn | 0-7695-1378-6 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19040 | - |
dc.description.abstract | Embedded cores are being increasingly used in the design of large System-on-a-Chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrator To reduce the verification complexity, the Port order fault (POF) model proposed in [1] has been used for verifying core-based designs and the corresponding verification pattern generation have been developed [2] [3]. Here we present in automorphic technique to improve the efficiency of the automatic verification pattern generation (AVPG) proposed in [3] for SoC design verification based on POF model. On average, the size of pattern sets obtained on the ISCAS-85 and MCNC benchmarks are 45% smaller and the run time decreases 16% as compared with the results of AVPG. | en_US |
dc.language.iso | en_US | en_US |
dc.title | An improved AVPG algorithm for SoC design verification using port order fault model | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 10TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | en_US |
dc.citation.spage | 431 | en_US |
dc.citation.epage | 436 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000173697300065 | - |
Appears in Collections: | Conferences Paper |