標題: On automatic-verification pattern generation for SoC with port-order fault model
作者: Wang, CY
Tung, SW
Jou, JY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: automatic-verification pattern generation (AVPG);design verification;IEEE P1500;port-order fault (POF);SoC;undetected port sequence (UPS)
公開日期: 1-四月-2002
摘要: Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrators. To reduce the verification complexity, the port-order fault (POF) model has been used for verifying core-based designs (Tung and Jon, 1998). In this paper, we present an automatic-verification pattern generation (AVPG) for SoC design verification based on the POF model and perform experiments on combinational and sequential benchmarks. Experimental results show that our AVPG can efficiently generate verification patterns with high POF coverage.
URI: http://dx.doi.org/10.1109/43.992770
http://hdl.handle.net/11536/28918
ISSN: 0278-0070
DOI: 10.1109/43.992770
期刊: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Volume: 21
Issue: 4
起始頁: 466
結束頁: 479
顯示於類別:期刊論文


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