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dc.contributor.authorWang, CYen_US
dc.contributor.authorTung, SWen_US
dc.contributor.authorJou, JYen_US
dc.date.accessioned2014-12-08T15:42:37Z-
dc.date.available2014-12-08T15:42:37Z-
dc.date.issued2002-04-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/43.992770en_US
dc.identifier.urihttp://hdl.handle.net/11536/28918-
dc.description.abstractEmbedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrators. To reduce the verification complexity, the port-order fault (POF) model has been used for verifying core-based designs (Tung and Jon, 1998). In this paper, we present an automatic-verification pattern generation (AVPG) for SoC design verification based on the POF model and perform experiments on combinational and sequential benchmarks. Experimental results show that our AVPG can efficiently generate verification patterns with high POF coverage.en_US
dc.language.isoen_USen_US
dc.subjectautomatic-verification pattern generation (AVPG)en_US
dc.subjectdesign verificationen_US
dc.subjectIEEE P1500en_US
dc.subjectport-order fault (POF)en_US
dc.subjectSoCen_US
dc.subjectundetected port sequence (UPS)en_US
dc.titleOn automatic-verification pattern generation for SoC with port-order fault modelen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/43.992770en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume21en_US
dc.citation.issue4en_US
dc.citation.spage466en_US
dc.citation.epage479en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000174664000007-
dc.citation.woscount15-
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