標題: | Dynamic characteristics measurement system for optical scanning micromirror |
作者: | Chiou, JC Lin, YC Chang, YC 電控工程研究所 Institute of Electrical and Control Engineering |
關鍵字: | scanning micromirror;scan speed;scan angle;scan non-linearity;optical performance of micromirror |
公開日期: | 2000 |
摘要: | This paper describes the development of a novel, flexible, with appropriate accuracy dynamic characteristics measurement system for optical scanning micromirror. With the system, we can measure dynamic behaviors such as transient response, scan speed, scan angle, scan repeatability, and scan non-linearity of the scanning micromirror devices. Moreover, the optical system performances such as scan spot size and even scan spot intensity can also be obtained. |
URI: | http://hdl.handle.net/11536/19203 http://dx.doi.org/10.1117/12.404902 |
ISBN: | 0-8194-3902-9 |
ISSN: | 0277-786X |
DOI: | 10.1117/12.404902 |
期刊: | MICROMACHINING AND MICROFABRICATION |
Volume: | 4230 |
起始頁: | 180 |
結束頁: | 186 |
Appears in Collections: | Conferences Paper |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.