標題: Dynamic characteristics measurement system for optical scanning micromirror
作者: Chiou, JC
Lin, YC
Chang, YC
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: scanning micromirror;scan speed;scan angle;scan non-linearity;optical performance of micromirror
公開日期: 2000
摘要: This paper describes the development of a novel, flexible, with appropriate accuracy dynamic characteristics measurement system for optical scanning micromirror. With the system, we can measure dynamic behaviors such as transient response, scan speed, scan angle, scan repeatability, and scan non-linearity of the scanning micromirror devices. Moreover, the optical system performances such as scan spot size and even scan spot intensity can also be obtained.
URI: http://hdl.handle.net/11536/19203
http://dx.doi.org/10.1117/12.404902
ISBN: 0-8194-3902-9
ISSN: 0277-786X
DOI: 10.1117/12.404902
期刊: MICROMACHINING AND MICROFABRICATION
Volume: 4230
起始頁: 180
結束頁: 186
Appears in Collections:Conferences Paper


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