Title: Dynamic characteristics measurement system for optical scanning micromirror
Authors: Chiou, JC
Lin, YC
Chang, YC
電控工程研究所
Institute of Electrical and Control Engineering
Keywords: scanning micromirror;scan speed;scan angle;scan non-linearity;optical performance of micromirror
Issue Date: 2000
Abstract: This paper describes the development of a novel, flexible, with appropriate accuracy dynamic characteristics measurement system for optical scanning micromirror. With the system, we can measure dynamic behaviors such as transient response, scan speed, scan angle, scan repeatability, and scan non-linearity of the scanning micromirror devices. Moreover, the optical system performances such as scan spot size and even scan spot intensity can also be obtained.
URI: http://hdl.handle.net/11536/19203
http://dx.doi.org/10.1117/12.404902
ISBN: 0-8194-3902-9
ISSN: 0277-786X
DOI: 10.1117/12.404902
Journal: MICROMACHINING AND MICROFABRICATION
Volume: 4230
Begin Page: 180
End Page: 186
Appears in Collections:Conferences Paper


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