The performance limiting factors as RF MOSFETs scaling down

標題:	The performance limiting factors as RF MOSFETs scaling down
作者:	Wu, YH Chin, A Liang, CS Wu, CC 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	2000
摘要:	The measured RF performance of 0.5, 0.25, and 0.18 mum MOSFETs gradually saturates as scaling down, which can be explained by the derived analytical equation and simulation. The overlap C-gd and non-quasi-static effect are the main factors but scales much slower than L-g.
URI:	http://hdl.handle.net/11536/19272 http://dx.doi.org/10.1109/RFIC.2000.854437
ISBN:	0-7803-6281-0
DOI:	10.1109/RFIC.2000.854437
期刊:	2000 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS
起始頁:	151
結束頁:	154
顯示於類別：	會議論文

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