Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Su, DC | en_US |
dc.contributor.author | Lee, JY | en_US |
dc.contributor.author | Hsu, CC | en_US |
dc.contributor.author | Chiu, MH | en_US |
dc.date.accessioned | 2014-12-08T15:27:04Z | - |
dc.date.available | 2014-12-08T15:27:04Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.isbn | 3-540-67943-X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19290 | - |
dc.description.abstract | The phase difference between s- and p- polarizations of the reflected light from a test material is measured using heterodyne interferometry. The measured data is substituted into the specially derived equations and the refractive index can be calculated. When an absorbing material is tested, a general heterodyne light source is used and two measurement processes should be performed because of its two unknown parameters to be solved. And only one measurement process is performed with a circularly polarized heterodyne light source for testing a non-absorbing material. Because the phase difference can be measured accurately with heterodyne interferometry, its performance is not affected by surrounding light noise. So, it is very stable and has a high resolution. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Measurements of material refractive indices using heterodyne interferometry | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS | en_US |
dc.citation.spage | 519 | en_US |
dc.citation.epage | 526 | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:000165949300064 | - |
Appears in Collections: | Conferences Paper |