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dc.contributor.authorSu, DCen_US
dc.contributor.authorLee, JYen_US
dc.contributor.authorHsu, CCen_US
dc.contributor.authorChiu, MHen_US
dc.date.accessioned2014-12-08T15:27:04Z-
dc.date.available2014-12-08T15:27:04Z-
dc.date.issued2000en_US
dc.identifier.isbn3-540-67943-Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/19290-
dc.description.abstractThe phase difference between s- and p- polarizations of the reflected light from a test material is measured using heterodyne interferometry. The measured data is substituted into the specially derived equations and the refractive index can be calculated. When an absorbing material is tested, a general heterodyne light source is used and two measurement processes should be performed because of its two unknown parameters to be solved. And only one measurement process is performed with a circularly polarized heterodyne light source for testing a non-absorbing material. Because the phase difference can be measured accurately with heterodyne interferometry, its performance is not affected by surrounding light noise. So, it is very stable and has a high resolution.en_US
dc.language.isoen_USen_US
dc.titleMeasurements of material refractive indices using heterodyne interferometryen_US
dc.typeProceedings Paperen_US
dc.identifier.journalINTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONSen_US
dc.citation.spage519en_US
dc.citation.epage526en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000165949300064-
Appears in Collections:Conferences Paper