Title: | Measurements of material refractive indices using heterodyne interferometry |
Authors: | Su, DC Lee, JY Hsu, CC Chiu, MH 光電工程學系 Department of Photonics |
Issue Date: | 2000 |
Abstract: | The phase difference between s- and p- polarizations of the reflected light from a test material is measured using heterodyne interferometry. The measured data is substituted into the specially derived equations and the refractive index can be calculated. When an absorbing material is tested, a general heterodyne light source is used and two measurement processes should be performed because of its two unknown parameters to be solved. And only one measurement process is performed with a circularly polarized heterodyne light source for testing a non-absorbing material. Because the phase difference can be measured accurately with heterodyne interferometry, its performance is not affected by surrounding light noise. So, it is very stable and has a high resolution. |
URI: | http://hdl.handle.net/11536/19290 |
ISBN: | 3-540-67943-X |
Journal: | INTERFEROMETRY IN SPECKLE LIGHT: THEORY AND APPLICATIONS |
Begin Page: | 519 |
End Page: | 526 |
Appears in Collections: | Conferences Paper |