完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Mang, OY | en_US |
dc.contributor.author | Sheen, CS | en_US |
dc.contributor.author | Shie, JS | en_US |
dc.date.accessioned | 2014-12-08T15:27:23Z | - |
dc.date.available | 2014-12-08T15:27:23Z | - |
dc.date.issued | 1997 | en_US |
dc.identifier.isbn | 0-7803-3748-4 | en_US |
dc.identifier.issn | 1091-5281 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19628 | - |
dc.description.abstract | Device parameters of thermal microsensors are essential for evaluating the sensor performances and their simulation modeling. We report an A.C. electrical method for extracting these parameters experimentally with relatively simple instrumentation. The basic parameters of resistive microsensors, the resistance, temperature coefficience of resistance, thermal capacitance and conductance, are derivable from the second harmonic signal of the output voltage induced by a sinusoidal driving current. The results obtained are compared with other methods. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Parameter extraction of resistive thermal microsensors by AC electrical method | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | IMTC/97 - IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE: SENSING, PROCESSING, NETWORKING, PROCEEDINGS VOLS 1 AND 2 | en_US |
dc.citation.spage | 893 | en_US |
dc.citation.epage | 897 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | 光電工程學系 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
dc.contributor.department | Department of Photonics | en_US |
dc.identifier.wosnumber | WOS:A1997BH95G00173 | - |
顯示於類別: | 會議論文 |