Modified process control chart in IC fabrication using clustering analysis

Full metadata record

DC Field	Value	Language
dc.contributor.author	Tong, LI	en_US
dc.contributor.author	Lee, WI	en_US
dc.date.accessioned	2014-12-08T15:27:23Z	-
dc.date.available	2014-12-08T15:27:23Z	-
dc.date.issued	1997	en_US
dc.identifier.isbn	0-7803-3574-0	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19631	-
dc.language.iso	en_US	en_US
dc.title	Modified process control chart in IC fabrication using clustering analysis	en_US
dc.type	Meeting Abstract	en_US
dc.identifier.journal	INNOVATION IN TECHNOLOGY MANAGEMENT - THE KEY TO GLOBAL LEADERSHIP: THE KEY TO GLOBAL LEADERSHIP	en_US
dc.citation.spage	704	en_US
dc.citation.epage	704	en_US
dc.contributor.department	工業工程與管理學系	zh_TW
dc.contributor.department	Department of Industrial Engineering and Management	en_US
dc.identifier.wosnumber	WOS:A1997BJ74R00332	-
Appears in Collections:	Conferences Paper