| 標題: | Low temperature deposited highly-conductive N-type SiC thin films |
| 作者: | Cheng, KL Cheng, HC Lee, WH Lee, C Yew, TR 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 公開日期: | 1997 |
| 摘要: | Low-temperature deposited highly-conductive SiC films has long been a goal for many researchers involved in hetero-junction bipolar transistor, thin-film transistor, solar cell...etc. Were in this paper, we study the influences of the diluted PH3 now rates on SiC film quality as well as electrical properties. PH+ was determined from residual gas analyzer to be the main dopant source. Phosphorous atoms will play a role of enhancing the SiC grain growth and resulting in a smaller film growth rate. Carrier concentrations increase monotonically with the diluted PH; now rates. While Hall mobility first increases than decreases with it due to a combination effect of the impurity scattering and a film quality improvement which dominates when the 1% PH3/H-2 flow rate is above or below 40 seem, respectively. |
| URI: | http://hdl.handle.net/11536/19643 |
| ISBN: | 1-55899-376-2 |
| ISSN: | 0272-9172 |
| 期刊: | POLYCRYSTALLINE THIN FILMS - STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS III |
| Volume: | 472 |
| 起始頁: | 463 |
| 結束頁: | 468 |
| Appears in Collections: | Conferences Paper |

