完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Cheng, KL | en_US |
dc.contributor.author | Cheng, HC | en_US |
dc.contributor.author | Lee, WH | en_US |
dc.contributor.author | Lee, C | en_US |
dc.contributor.author | Yew, TR | en_US |
dc.date.accessioned | 2014-12-08T15:27:23Z | - |
dc.date.available | 2014-12-08T15:27:23Z | - |
dc.date.issued | 1997 | en_US |
dc.identifier.isbn | 1-55899-376-2 | en_US |
dc.identifier.issn | 0272-9172 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/19643 | - |
dc.description.abstract | Low-temperature deposited highly-conductive SiC films has long been a goal for many researchers involved in hetero-junction bipolar transistor, thin-film transistor, solar cell...etc. Were in this paper, we study the influences of the diluted PH3 now rates on SiC film quality as well as electrical properties. PH+ was determined from residual gas analyzer to be the main dopant source. Phosphorous atoms will play a role of enhancing the SiC grain growth and resulting in a smaller film growth rate. Carrier concentrations increase monotonically with the diluted PH; now rates. While Hall mobility first increases than decreases with it due to a combination effect of the impurity scattering and a film quality improvement which dominates when the 1% PH3/H-2 flow rate is above or below 40 seem, respectively. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Low temperature deposited highly-conductive N-type SiC thin films | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | POLYCRYSTALLINE THIN FILMS - STRUCTURE, TEXTURE, PROPERTIES AND APPLICATIONS III | en_US |
dc.citation.volume | 472 | en_US |
dc.citation.spage | 463 | en_US |
dc.citation.epage | 468 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000071462100071 | - |
顯示於類別: | 會議論文 |