Fast full-wave characterization of arbitrary planar microstrip geometries

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Hsieh, RC	en_US
dc.contributor.author	Kuo, JT	en_US
dc.date.accessioned	2014-12-08T15:27:29Z	-
dc.date.available	2014-12-08T15:27:29Z	-
dc.date.issued	1997	en_US
dc.identifier.isbn	962-442-117-X	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19753	-
dc.description.abstract	A very fast computation method is proposed for the mixed potential integral equation (MPIE) analysis of microstrip elements in a multilayered medium. The fast Hankel transform (FHT) algorithm is employed in this method to calculate the spatial-domain Green's function. Calculated results for some microstrip filters are compared with measurements.	en_US
dc.language.iso	en_US	en_US
dc.title	Fast full-wave characterization of arbitrary planar microstrip geometries	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	1997 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS I-III	en_US
dc.citation.spage	685	en_US
dc.citation.epage	688	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000072506400170	-
顯示於類別：	會議論文