A SPICE simulation model for field emission triode

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Lu, CW	en_US
dc.contributor.author	Lee, CL	en_US
dc.contributor.author	Huang, JM	en_US
dc.date.accessioned	2014-12-08T15:27:38Z	-
dc.date.available	2014-12-08T15:27:38Z	-
dc.date.issued	1996	en_US
dc.identifier.isbn	0-7803-3594-5	en_US
dc.identifier.uri	http://hdl.handle.net/11536/19900	-
dc.description.abstract	In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.	en_US
dc.language.iso	en_US	en_US
dc.title	A SPICE simulation model for field emission triode	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	IVMC '96 - 9TH INTERNATIONAL VACUUM MICROELECTRONICS CONFERENCE, TECHNICAL DIGEST	en_US
dc.citation.spage	62	en_US
dc.citation.epage	66	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1996BJ05U00014	-
顯示於類別：	會議論文