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dc.contributor.authorShen, WZen_US
dc.contributor.authorLin, JYen_US
dc.contributor.authorLu, JMen_US
dc.date.accessioned2014-12-08T15:27:39Z-
dc.date.available2014-12-08T15:27:39Z-
dc.date.issued1996en_US
dc.identifier.isbn0-7803-3662-3en_US
dc.identifier.urihttp://hdl.handle.net/11536/19921-
dc.description.abstractIn this paper, we present CB-Power, a hierarchical cell-based power characterization and estimation environment for static CMOS circuits. The environment is based on a cell characterization system for timing, power and input capacitance and on a cell-based power estimator, The characterization system can characterize basic, complex and transmission gates. During the characterization, input slew rate, output loading, capacitive feedthrough effect and the logic state dependence of nodes in a cell are all taken into account, The characterization methodology separates the power consumption of a cell into three components, e.g., capacitive feedthrough power, short-circuit power, and dynamic power. With the characterization data, a estimator (CBPE) embedded in Verilog-XL is used for estimating the power consumption of a circuit. CB-Power is also a hierarchical power estimator. Macrocells such as flip-flops and adders are partitioned into primitive gates during power estimation. Experimental results on a set of MCNC benchmark circuits show that CB-Power provides within 6% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.en_US
dc.language.isoen_USen_US
dc.titleCB-Power: A hierarchical cell-based power characterization and estimation environment for static CMOS circuitsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS OF THE ASP-DAC '97 - ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE 1997en_US
dc.citation.spage189en_US
dc.citation.epage194en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:A1996BJ06S00030-
Appears in Collections:Conferences Paper