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dc.contributor.authorCHANG, SKen_US
dc.contributor.authorHSU, PLen_US
dc.contributor.authorLIN, KLen_US
dc.date.accessioned2014-12-08T15:03:27Z-
dc.date.available2014-12-08T15:03:27Z-
dc.date.issued1995-04-01en_US
dc.identifier.issn0020-7721en_US
dc.identifier.urihttp://hdl.handle.net/11536/1994-
dc.description.abstractBy employing st transfer matrix approach we develop straightforward design procedures to construct a fault-identification filter (FIDF) to achieve failure detection and isolation. Furthermore, we derive the necessary and sufficient conditions for the synthesis of the FIDF. The condition entails a parametrization of the set of all achievable diagonal fault/residual maps and the set of all existing FIDFs. Since the diagnostic performance of the FIDF is influenced significantly by the model uncertainty, we present a framework for analysing the FIDF by incorporating modelling errors. Consequently, a criterion to determine an adequate threshold for the FIDF based on robust control theory is derived. Examples are used to illustrate the validity of this approach.en_US
dc.language.isoen_USen_US
dc.titleA PARAMETRIC TRANSFER-MATRIX APPROACH TO FAULT-IDENTIFICATION FILTER DESIGN AND THRESHOLD SELECTIONen_US
dc.typeArticleen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF SYSTEMS SCIENCEen_US
dc.citation.volume26en_US
dc.citation.issue4en_US
dc.citation.spage741en_US
dc.citation.epage754en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1995RC66800002-
dc.citation.woscount3-
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