完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | CHANG, SK | en_US |
dc.contributor.author | HSU, PL | en_US |
dc.contributor.author | LIN, KL | en_US |
dc.date.accessioned | 2014-12-08T15:03:27Z | - |
dc.date.available | 2014-12-08T15:03:27Z | - |
dc.date.issued | 1995-04-01 | en_US |
dc.identifier.issn | 0020-7721 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/1994 | - |
dc.description.abstract | By employing st transfer matrix approach we develop straightforward design procedures to construct a fault-identification filter (FIDF) to achieve failure detection and isolation. Furthermore, we derive the necessary and sufficient conditions for the synthesis of the FIDF. The condition entails a parametrization of the set of all achievable diagonal fault/residual maps and the set of all existing FIDFs. Since the diagnostic performance of the FIDF is influenced significantly by the model uncertainty, we present a framework for analysing the FIDF by incorporating modelling errors. Consequently, a criterion to determine an adequate threshold for the FIDF based on robust control theory is derived. Examples are used to illustrate the validity of this approach. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A PARAMETRIC TRANSFER-MATRIX APPROACH TO FAULT-IDENTIFICATION FILTER DESIGN AND THRESHOLD SELECTION | en_US |
dc.type | Article | en_US |
dc.identifier.journal | INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE | en_US |
dc.citation.volume | 26 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 741 | en_US |
dc.citation.epage | 754 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | 電控工程研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
dc.identifier.wosnumber | WOS:A1995RC66800002 | - |
dc.citation.woscount | 3 | - |
顯示於類別: | 期刊論文 |