INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS

標題:	INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS
作者:	WANG, TH CHANG, TE HUANG, CM 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	1994
URI:	http://hdl.handle.net/11536/20108
ISBN:	0-7803-2111-1
期刊:	INTERNATIONAL ELECTRON DEVICES MEETING 1994 - IEDM TECHNICAL DIGEST
起始頁:	161
結束頁:	164
Appears in Collections:	Conferences Paper