INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS

Full metadata record

DC Field	Value	Language
dc.contributor.author	WANG, TH	en_US
dc.contributor.author	CHANG, TE	en_US
dc.contributor.author	HUANG, CM	en_US
dc.date.accessioned	2014-12-08T15:27:51Z	-
dc.date.available	2014-12-08T15:27:51Z	-
dc.date.issued	1994	en_US
dc.identifier.isbn	0-7803-2111-1	en_US
dc.identifier.uri	http://hdl.handle.net/11536/20108	-
dc.language.iso	en_US	en_US
dc.title	INTERFACE TRAP INDUCED THERMIONIC AND FIELD EMISSION CURRENT IN OFF-STATE MOSFETS	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	INTERNATIONAL ELECTRON DEVICES MEETING 1994 - IEDM TECHNICAL DIGEST	en_US
dc.citation.spage	161	en_US
dc.citation.epage	164	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1994BC55U00036	-
Appears in Collections:	Conferences Paper