完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, Je-Wei | en_US |
dc.contributor.author | Liu, En-Ting | en_US |
dc.contributor.author | Wu, Chien-Hung | en_US |
dc.contributor.author | Hsieh, Ing-Jar | en_US |
dc.contributor.author | Chao, Tien-Sheng | en_US |
dc.date.accessioned | 2014-12-08T15:28:09Z | - |
dc.date.available | 2014-12-08T15:28:09Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.isbn | 978-1-60768-291-2 | en_US |
dc.identifier.issn | 1938-5862 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/20374 | - |
dc.identifier.uri | http://dx.doi.org/10.1149/1.3647856 | en_US |
dc.description.abstract | This paper is to investigate the possibility to fabricate the inverted-pyramid structure on silicon wafer base solar cell by using laser scribing technology. The UV spectrometer and SEM had also been used to observe the reflectance and microstructure of the wafer surface. In this experiment, a Q-switched Nd:YAG laser operating at wavelength of 1064nm is used to scribe on the p-type wafer surface to produce inverted-pyramid structure. In order to remove the laser damage, we used acid etching and Alkaline etching solutions to smooth the damage region and inverted pyramid structure formed, simultaneously. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Formation of inverted-pyramid structure by modifying laser processing parameters and acid etching time | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1149/1.3647856 | en_US |
dc.identifier.journal | STUDENT POSTERS (GENERAL) - 219TH ECS MEETING | en_US |
dc.citation.volume | 35 | en_US |
dc.citation.issue | 31 | en_US |
dc.citation.spage | 67 | en_US |
dc.citation.epage | 72 | en_US |
dc.contributor.department | 電子物理學系 | zh_TW |
dc.contributor.department | Department of Electrophysics | en_US |
dc.identifier.wosnumber | WOS:000309546100009 | - |
顯示於類別: | 會議論文 |