標題: Morphologies and plane indices of pyramid patterns on wet-etched patterned sapphire substrate
作者: Chen, Yu-Chung
Lin, Bo-Wen
Hsu, Wen-Ching
Wu, YewChung Sermon
材料科學與工程學系
Department of Materials Science and Engineering
關鍵字: Patterned sapphire substrate;Wet etching process;Crystal structure;Optical materials;Properties;Surfaces
公開日期: 1-三月-2014
摘要: A wet etching process was employed to investigate the evolution of pyramids on the patterned sapphire substrate (PSS). It has been found that the PSS comprised a hexagonal pyramid covered with six facets {3 (4) over bar 1 7} when disk-shaped SiO2 mask still remained. Three facets {1 (1) over bar 0 5} were exposed when mask was etched away. In this study, a continuous etching process was performed. It was found that another six facets {4 (5) over bar 1 30} and another three facets {1 (1) over bar 0 10} appeared on the bottom and the top of pyramid. Finally, when the etching time reached around 5 min, most of pyramids on the PSS disappeared. (C) 2013 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.matlet.2013.12.035
http://hdl.handle.net/11536/23762
ISSN: 0167-577X
DOI: 10.1016/j.matlet.2013.12.035
期刊: MATERIALS LETTERS
Volume: 118
Issue: 
起始頁: 72
結束頁: 75
顯示於類別:期刊論文


文件中的檔案:

  1. 000331666600020.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。