標題: | Morphologies and plane indices of pyramid patterns on wet-etched patterned sapphire substrate |
作者: | Chen, Yu-Chung Lin, Bo-Wen Hsu, Wen-Ching Wu, YewChung Sermon 材料科學與工程學系 Department of Materials Science and Engineering |
關鍵字: | Patterned sapphire substrate;Wet etching process;Crystal structure;Optical materials;Properties;Surfaces |
公開日期: | 1-Mar-2014 |
摘要: | A wet etching process was employed to investigate the evolution of pyramids on the patterned sapphire substrate (PSS). It has been found that the PSS comprised a hexagonal pyramid covered with six facets {3 (4) over bar 1 7} when disk-shaped SiO2 mask still remained. Three facets {1 (1) over bar 0 5} were exposed when mask was etched away. In this study, a continuous etching process was performed. It was found that another six facets {4 (5) over bar 1 30} and another three facets {1 (1) over bar 0 10} appeared on the bottom and the top of pyramid. Finally, when the etching time reached around 5 min, most of pyramids on the PSS disappeared. (C) 2013 Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.matlet.2013.12.035 http://hdl.handle.net/11536/23762 |
ISSN: | 0167-577X |
DOI: | 10.1016/j.matlet.2013.12.035 |
期刊: | MATERIALS LETTERS |
Volume: | 118 |
Issue: | |
起始頁: | 72 |
結束頁: | 75 |
Appears in Collections: | Articles |
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