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DC 欄位語言
dc.contributor.authorWU, PCen_US
dc.contributor.authorWANG, FJen_US
dc.date.accessioned2014-12-08T15:03:30Z-
dc.date.available2014-12-08T15:03:30Z-
dc.date.issued1995-03-01en_US
dc.identifier.issn0164-0925en_US
dc.identifier.urihttp://dx.doi.org/10.1145/201059.201064en_US
dc.identifier.urihttp://hdl.handle.net/11536/2038-
dc.description.abstractAlthough the circularity test problem for attribute grammars (AGs) has been proven to be intrinsically exponential, to date, a worst case for the existing circularity test algorithms has yet to be presented. This note presents a worst-case AG in which the number of incomparable dependency graphs induced at the root is exponential. The worst case can help to clarify the complexity of the problem.en_US
dc.language.isoen_USen_US
dc.subjectALGORITHMSen_US
dc.subjectLANGUAGESen_US
dc.subjectTHEORYen_US
dc.subjectATTRIBUTE GRAMMARSen_US
dc.subjectCIRCULARITY TESTen_US
dc.subjectDEPENDENCY GRAPHSen_US
dc.titleA WORST-CASE OF CIRCULARITY TEST ALGORITHMS FOR ATTRIBUTE GRAMMARSen_US
dc.typeNoteen_US
dc.identifier.doi10.1145/201059.201064en_US
dc.identifier.journalACM TRANSACTIONS ON PROGRAMMING LANGUAGES AND SYSTEMSen_US
dc.citation.volume17en_US
dc.citation.issue2en_US
dc.citation.spage228en_US
dc.citation.epage232en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.identifier.wosnumberWOS:A1995RE61200004-
dc.citation.woscount0-
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