A WORST-CASE OF CIRCULARITY TEST ALGORITHMS FOR ATTRIBUTE GRAMMARS

doi:10.1145/201059.201064

Full metadata record

DC Field	Value	Language
dc.contributor.author	WU, PC	en_US
dc.contributor.author	WANG, FJ	en_US
dc.date.accessioned	2014-12-08T15:03:30Z	-
dc.date.available	2014-12-08T15:03:30Z	-
dc.date.issued	1995-03-01	en_US
dc.identifier.issn	0164-0925	en_US
dc.identifier.uri	http://dx.doi.org/10.1145/201059.201064	en_US
dc.identifier.uri	http://hdl.handle.net/11536/2038	-
dc.description.abstract	Although the circularity test problem for attribute grammars (AGs) has been proven to be intrinsically exponential, to date, a worst case for the existing circularity test algorithms has yet to be presented. This note presents a worst-case AG in which the number of incomparable dependency graphs induced at the root is exponential. The worst case can help to clarify the complexity of the problem.	en_US
dc.language.iso	en_US	en_US
dc.subject	ALGORITHMS	en_US
dc.subject	LANGUAGES	en_US
dc.subject	THEORY	en_US
dc.subject	ATTRIBUTE GRAMMARS	en_US
dc.subject	CIRCULARITY TEST	en_US
dc.subject	DEPENDENCY GRAPHS	en_US
dc.title	A WORST-CASE OF CIRCULARITY TEST ALGORITHMS FOR ATTRIBUTE GRAMMARS	en_US
dc.type	Note	en_US
dc.identifier.doi	10.1145/201059.201064	en_US
dc.identifier.journal	ACM TRANSACTIONS ON PROGRAMMING LANGUAGES AND SYSTEMS	en_US
dc.citation.volume	17	en_US
dc.citation.issue	2	en_US
dc.citation.spage	228	en_US
dc.citation.epage	232	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1995RE61200004	-
dc.citation.woscount	0	-
Appears in Collections:	Articles

Files in This Item:

A1995RE61200004.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.