標題: Metallic conduction and large electron-phonon-impurity interference effect in single TiSi nanowires
作者: Hsu, Wei-Che
Chen, Chao-Chun
Lin, Yong-Han
Lin, Huang-Kai
Chiu, Hsin-Tien
Lin, Juhn-Jong
電子物理學系
應用化學系
物理研究所
Department of Electrophysics
Department of Applied Chemistry
Institute of Physics
關鍵字: Chemical vapor deposition reaction;TiSi nanowire;Silicide;Electron-phonon scattering;Electron-phonon-impurity interference;Focused-ion-beam-induced deposition
公開日期: 5-九月-2012
摘要: We report on the first electrical characterizations of single-crystalline TiSi nanowires (NWs) synthesized by chemical vapor deposition reactions. By utilizing the focused-ion-beam-induced deposition technique, we have delicately made four-probe contacts onto individual NWs. The NW resistivities have been measured between 2 and 300 K, which reveal overall metallic conduction with small residual resistivity ratios in the NWs. Surprisingly, we find that the effect due to the interference processes between the elastic electron scattering and the electron-phonon scattering largely dominates over the usual Boltzmann transport even at room temperature. Such prominent electron-phonon-impurity interference effect is ascribed to the presence of large amounts of disorder and high Debye temperatures in TiSi NWs.
URI: http://dx.doi.org/10.1186/1556-276X-7-500
http://hdl.handle.net/11536/20692
ISSN: 1931-7573
DOI: 10.1186/1556-276X-7-500
期刊: NANOSCALE RESEARCH LETTERS
Volume: 7
Issue: 
結束頁: 
顯示於類別:期刊論文


文件中的檔案:

  1. 000311786200001.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。