標題: | Nanoscale Structure and Mechanism for Enhanced Electromechanical Response of Highly Strained BiFeO(3) Thin Films |
作者: | Damodaran, Anoop R. Liang, Chen-Wei He, Qing Peng, Chun-Yen Chang, Li Chu, Ying-Hao Martin, Lane W. 材料科學與工程學系 Department of Materials Science and Engineering |
公開日期: | 26-七月-2011 |
摘要: | The presence of a variety of structural variants in BiFeO(3) thin films give rise to exotic electric-field-induced responses and resulting electromechanical responses as large as 5%. Using high-resolution X-ray diffraction and scanning-probe-microscopy-based studies the numerous phases present at the phase boundaries are identified and an intermediate monoclinic phase, in addition to the previously observed rhombohedral- and tetragonal-like phases, is discovered. |
URI: | http://dx.doi.org/10.1002/adma.201101164 http://hdl.handle.net/11536/21394 |
ISSN: | 0935-9648 |
DOI: | 10.1002/adma.201101164 |
期刊: | ADVANCED MATERIALS |
Volume: | 23 |
Issue: | 28 |
起始頁: | 3170 |
結束頁: | + |
顯示於類別: | 期刊論文 |